CRTM-R1
ULVAC has developed new quartz crystal deposition controllers based on our long-time experience and technologies.
Contributes to improved quality and reliability in vapor deposition processes.
CRTM-R1-EL
CRTM-R1-EL is a crystal deposition monitor optimized for the organic EL deposition process.
New measurement method provides excellent resolution and rate stability.
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Excellent rate stability and resolution make it suitable for low-rate control. |
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Ability value (CI value) measurement function improves crystal anomaly detection. |
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Simultaneous vapor deposition control of up to 8 sources is possible. (add option) |
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Communication method supports Ethernet and RS-232C. |
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Various log data can be saved. Data can be transferred to USB and analyzed on a PC. |
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CRTM-R1 |
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Thickness and rate control for vapor deposition of metal thin film or optical thin film |
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CRTM-R1-EL |
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Film thickness and rate monitoring in OLED deposition process. |
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Contact us for more product information and specifications.